MicroStation à pointes sous vide

Gallery and technical drawings

Description

Key features

• 3 Versions : Peltier (-40°C to 200°C) – Azote ( 77K to 300K) ou céramique (ambiante – 750°)
• Options mesure reflectivité / Raman
• Accessoire : Pompe à vide
• Comptabilité : 1260/1296 , Modulab XM MTS et MaterialsLab XM

Technical specifications

P

C LN XM 12xx

Tel

(865) 425-1289 Tel: +44 (0) 1252 556800

materials.

materials w PC software provides

Connections

2, 3 ou 4

Heater type

Liquid nitrogen (Dewar)

PTH variant

Light irradiated from under sample

Vacuum pump

129631A

- 1260A /1296A

optimized for light emission tests

Probe material

Gold-coated inconel

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- ModuLab XM MTS

w Four electrodes, can be used in

Hall measurement



Maximum cooling /

1°C/sec

Sample stage size

18 mm diameter

Temperature range

77K to 300K (includes LN dewar)

Control unit power

76 W (PT/PTH/LN2), Temperature accuracy ±0.5°C

Dimensions & masse

140 mm x 70 mm x 24.5 mm / 650g

Dimensions (w.d.h)

140 mm x 70 mm x 24.5 mm

Raman, reflectivity

  

-195 °C to 750 °C.

Peltier 129630 PT/PTH

Control unit voltage

100-220 V, 50-60 Hz heating rate

Controller Interface

RS485 (serial port)

Photocurrent mapping

 

components including

materials characterization

Sample chamber volume

<100 cc

Vacuum sample chamber

1 x 10-7 L.Torr/s

4-point probing method

Free-stop

Electrical connections

4x SMA (female)

Weight (probe station)

650 g

Ferroelectric materials

   

Vacuum/vent connections

2x 1/4” standard Swagelock

experiment to the next.

w Sensor materials

positioned on the sample

Heater type Peltier

sensors, and solid state

w Fuel cell and solid electrolyte

temperature variants for

The following product variants are

these probe stations are

grain boundaries and electrodes control

vacuum probe systems for

w High temperature dielectrics and measurements including I-V, Pulse,

Systems can be configured

Micro Vacuum Probe Stations

Nextron have joined forces

systems...

These reference grade test

emission options

to provide a wide range of

Solartron materials test systems

to studying your materials

Ceramic 129630 CHL/CHH

testing ceramics, polymers,

insulators C-V, Impedance, and Mott-Schottky.

high precision time domain /

laboratory

temperature controlled micro

provide a wide range of electrical

characterizing your materials

available:

to your specific requirements

Compare the following amazing w Wide frequency range from

Semiconductor characterization

    

As the “micro” name implies

w Studies of bulk and interfaces; measurements with temperature

I-V measurement (2, 3, 4 probe)

   

•฀ 1260A Impedance Analyzer

heating rate

Sensors and solid-state materials

   

extremely small (140 mm / 5.5”)

w Electroceramics

(dielectric, ionic, semiconductor,

w RT to 450° / 750°C

Display materials characterization

    

w Electronic and display materials

materials can be analyzed

Thermal hysteresis and conductivity

  

w Solartron Analytical’s range of

convenient to move around your

Capacitance, Mott-Schottky, Dielectrics

    

EIS (Electrical Impedance Spectroscopy)

    

using reference grade system facilities

10 μHz to 32 MHz enables full

Electro/photoluminescence & photovoltaic

    

129630 Series Micro Vacuum Probe Stations

129630PT/PTH Micro Vacuum Probe Station (Peltier)

Taille échantillon (fonction de la version

Peltier (18*18mm), céramique ( diamètre 12.7mm), Azote (diamètre 18mm)

•฀ MaterialsLab XM Materials Test System

129630 P/C/LN Equip

Solartron Analytical and Applications include

Solartron materials test

Solartron Analytical materials test products, including

Maximum cooling / 20K/sec

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df®

Applications

• Mesures I/V, C/V, Mott-Schottky, impédance
• Développement et caractérisation : Céramiques, diéléctriques, piles à combustibles
• Développement et caractérisation : electrolyte solide, electrocéramiques
• Composants electroniques